Result: Structural, Syntactic, and Statistical Pattern Recognition
Title:
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings / edited by Edwin R. Hancock, Richard C Wilson, Terry Windeatt, Ilkay Ulusoy, Francisco Escolano
Responsible:
Edition:
1st ed. 2010
Published:
Berlin, Heidelberg : Springer Berlin Heidelberg, 2010
Distribution:
Cham : Springer International Publishing AG
Extent:
1 Online-Ressource (XV, 758 Seiten) : 246 illus.
Format:
Language:
English
Series/ Mutipart item:
Image Processing, Computer Vision, Pattern Recognition, and Graphics, ISSN 3004-9954 ; 6218
Other editions:
Erscheint auch als Druck-Ausgabe: Structural, Syntactic, and Statistical Pattern Recognition. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2010. - ISBN 9783642149795
RVK-Notation:
Subject headings:
ISBN:
9783642149801 ; 3642149804 ; 978--364214979-5 (Sekundärausgabe) ; 978--364214981-8 (Sekundärausgabe)
DOI:
10.1007/978-3-642-14980-1