ISO-690 (author-date, English)

SUN, Shih-Feng und PODGURSKI, Andy, 2016. Properties of Effective Metrics for Coverage-Based Statistical Fault Localization. In: . 1 April 2016.

Elsevier - Harvard (with titles)

Sun, S.-F., Podgurski, A., 2016. Properties of Effective Metrics for Coverage-Based Statistical Fault Localization, in: . https://doi.org/10.1109/ICST.2016.31

American Psychological Association 7th edition

Sun, S.-F., & Podgurski, A. (2016, April 1). Properties of Effective Metrics for Coverage-Based Statistical Fault Localization. https://doi.org/10.1109/ICST.2016.31

Springer - Basic (author-date)

Sun S-F, Podgurski A (2016) Properties of Effective Metrics for Coverage-Based Statistical Fault Localization

Juristische Zitierweise (Stüber) (Deutsch)

Sun, Shih-Feng/ Podgurski, Andy, Properties of Effective Metrics for Coverage-Based Statistical Fault Localization, 2016, .

Bitte prüfen Sie die Zitate auf Korrektheit, bevor Sie diese in Ihre Arbeit einfügen.