Treffer: Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
Title:
Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
Authors:
Source:
2016 IEEE International Conference on Software Testing, Verification and Validation (ICST) Software Testing, Verification and Validation (ICST), 2016 IEEE International Conference on. :124-134 Apr, 2016
Relation:
2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)
Database:
IEEE Xplore Digital Library