HSIA, L. A., VERNIZZI, G., LANZEROTTI, M. Y., LANGLEY, D., SEERY, M. K. und ORLANDO, L., 2015. Topological constraints of gate-level circuits obtained through standard cell recognition (SCR). In: . 1 Juni 2015.
Elsevier - Harvard (with titles)Hsia, L.A., Vernizzi, G., Lanzerotti, M.Y., Langley, D., Seery, M.K., Orlando, L., 2015. Topological constraints of gate-level circuits obtained through standard cell recognition (SCR), in: . https://doi.org/10.1109/NAECON.2015.7443061
American Psychological Association 7th editionHsia, L. A., Vernizzi, G., Lanzerotti, M. Y., Langley, D., Seery, M. K., & Orlando, L. (2015, Juni 1). Topological constraints of gate-level circuits obtained through standard cell recognition (SCR). https://doi.org/10.1109/NAECON.2015.7443061
Springer - Basic (author-date)Hsia LA, Vernizzi G, Lanzerotti MY, Langley D, Seery MK, Orlando L (2015) Topological constraints of gate-level circuits obtained through standard cell recognition (SCR)
Juristische Zitierweise (Stüber) (Deutsch)Hsia, L. A./ Vernizzi, G./ Lanzerotti, M. Y./ Langley, D./ Seery, M. K./ Orlando, L., Topological constraints of gate-level circuits obtained through standard cell recognition (SCR), 2015, .