Treffer: Topological constraints of gate-level circuits obtained through standard cell recognition (SCR)
Title:
Topological constraints of gate-level circuits obtained through standard cell recognition (SCR)
Authors:
Source:
2015 National Aerospace and Electronics Conference (NAECON) Aerospace and Electronics Conference (NAECON), 2015 National. :165-175 Jun, 2015
Relation:
NAECON 2015 - IEEE National Aerospace and Electronics Conference
Database:
IEEE Xplore Digital Library