YEOH ENG HONG und WE, M.T.T., 1997. The application of novel failure analysis techniques for advanced multi-layered CMOS devices. In: . 1 Januar 1997.
Elsevier - Harvard (with titles)Yeoh Eng Hong, We, M., 1997. The application of novel failure analysis techniques for advanced multi-layered CMOS devices, in: . https://doi.org/10.1109/TEST.1997.639631
American Psychological Association 7th editionYeoh Eng Hong, & We, M. (1997, Januar 1). The application of novel failure analysis techniques for advanced multi-layered CMOS devices. https://doi.org/10.1109/TEST.1997.639631
Springer - Basic (author-date)Yeoh Eng Hong, We M (1997) The application of novel failure analysis techniques for advanced multi-layered CMOS devices
Juristische Zitierweise (Stüber) (Deutsch)Yeoh Eng Hong/ We, M.T.T., The application of novel failure analysis techniques for advanced multi-layered CMOS devices, 1997, .