Treffer: The application of novel failure analysis techniques for advanced multi-layered CMOS devices
Title:
The application of novel failure analysis techniques for advanced multi-layered CMOS devices
Authors:
Source:
Proceedings International Test Conference 1997 Test conference Test Conference, 1997. Proceedings., International. :304-309 1997
Relation:
Proceedings International Test Conference 1997
Database:
IEEE Xplore Digital Library