ISO-690 (author-date, English)

WANG, X., YUE, H., JIANG, N., LI, Z., DENG, J., HUANG, Y., QIU, M. und WEI, X., 2026. FR2 e RAM: A Fault-Resilient Graph Processing Paradigm in Realistic Re RAMs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 1 Januar 2026. Vol. 45, no. 1, p. 94-107. DOI 10.1109/TCAD.2025.3581138.

Elsevier - Harvard (with titles)

Wang, X., Yue, H., Jiang, N., Li, Z., Deng, J., Huang, Y., Qiu, M., Wei, X., 2026. FR2 e RAM: A Fault-Resilient Graph Processing Paradigm in Realistic Re RAMs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 45, 94-107. https://doi.org/10.1109/TCAD.2025.3581138

American Psychological Association 7th edition

Wang, X., Yue, H., Jiang, N., Li, Z., Deng, J., Huang, Y., Qiu, M., & Wei, X. (2026). FR2 e RAM: A Fault-Resilient Graph Processing Paradigm in Realistic Re RAMs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions On, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., 45(1), 94-107. https://doi.org/10.1109/TCAD.2025.3581138

Springer - Basic (author-date)

Wang X, Yue H, Jiang N, Li Z, Deng J, Huang Y, Qiu M, Wei X (2026) FR2 e RAM: A Fault-Resilient Graph Processing Paradigm in Realistic Re RAMs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 45:94-107. https://doi.org/10.1109/TCAD.2025.3581138

Juristische Zitierweise (Stüber) (Deutsch)

Wang, X./ Yue, H./ Jiang, N./ Li, Z./ Deng, J./ Huang, Y./ Qiu, M./ Wei, X., FR2 e RAM: A Fault-Resilient Graph Processing Paradigm in Realistic Re RAMs, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2026, 94-107.

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