Treffer: Flying-Probe Testing: A Trajectory Planner and a Benchmark Suite
Title:
Flying-Probe Testing: A Trajectory Planner and a Benchmark Suite
Authors:
Source:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 44(12):4807-4817 Dec, 2025
Database:
IEEE Xplore Digital Library