LIN, Bill, 2015. Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. New York, NY: ACM. ISBN 9781450334860.
Elsevier - Harvard (with titles)Lin, B., 2015. Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. ACM, New York, NY.
American Psychological Association 7th editionLin, B. (ca. 2015). Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems [Cd]. ACM.
Springer - Basic (author-date)Lin B (2015) Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. ACM, New York, NY
Juristische Zitierweise (Stüber) (Deutsch)Lin, Bill, Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, NY 2015.