Treffer: Proceedings / International Test Conference 1993, [October 17 - 21, 1993, Convention Center, Baltimore, Maryland, USA]

Veröffent­licht:
Altoona, Pa. : ITC Office, 1993
Umfang:
XII, 1065 S. : Ill., graph. Darst. ; 29 cm
Publikationstyp:
Buch
Sprache:
Englisch
Anmerkungen:
IEEE catalog number 93CH3356-3
Kongr.-Thema: Designing, testing, and diagnostics - join them
IEEE Computer Society Press order number 4192-02"--P. ii
Includes bibliographical references and index
RVK-Notation:
ISBN:
0780314301 ; 0780314298 ; 078031431X