EGERTON, Ray, 2005. Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM. Boston, MA: Imprint: Springer. ISBN 9780387260167.
Elsevier - Harvard (with titles)Egerton, R., 2005. Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM. Imprint: Springer, Boston, MA. https://doi.org/10.1007/b136495
American Psychological Association 7th editionEgerton, R. (ca. 2005). Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM [Cd]. Imprint: Springer. https://doi.org/10.1007/b136495
Springer - Basic (author-date)Egerton R (2005) Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM. Imprint: Springer, Boston, MA
Juristische Zitierweise (Stüber) (Deutsch)Egerton, Ray, Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM, Boston, MA 2005.