Result: Structural, Syntactic and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006: proceedings
Title:
Structural, Syntactic and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006: proceedings
Authors:
Publisher Information:
2006
Document Type:
Electronic Resource
Electronic Resource
Index Terms:
Availability:
Open access content. Open access content
Note:
English
Other Numbers:
HNK oai:repository.ust.hk:1783.1-12649
Structural, Syntactic and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006: proceedings / Edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder. Berlin: Springer, 2006
895562171
Structural, Syntactic and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006: proceedings / Edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder. Berlin: Springer, 2006
895562171
Contributing Source:
HONG KONG UNIV OF SCI & TECH, THE
From OAIster®, provided by the OCLC Cooperative.
From OAIster®, provided by the OCLC Cooperative.
Accession Number:
edsoai.ocn895562171
Database:
OAIster