HAN, Sungmin, KIM, Hyoungshick, LEE, Hojoon, MOON, Hyungon, JEON, Yuseok, BAE, Ho, YEO, Donghyun, AHN, Gail-Joon und LEE, Sangkyun, 2025. Dependable Code Repair with LLMs: AI-Driven Vulnerability Detection and Automated Patching. In: . 3 November 2025.
Elsevier - Harvard (with titles)Han, S., Kim, H., Lee, H., Moon, H., Jeon, Y., Bae, H., Yeo, D., Ahn, G.-J., Lee, S., 2025. Dependable Code Repair with LLMs: AI-Driven Vulnerability Detection and Automated Patching, in: . https://doi.org/10.1109/PRDC67299.2025.00032
American Psychological Association 7th editionHan, S., Kim, H., Lee, H., Moon, H., Jeon, Y., Bae, H., Yeo, D., Ahn, G.-J., & Lee, S. (2025, November 3). Dependable Code Repair with LLMs: AI-Driven Vulnerability Detection and Automated Patching. https://doi.org/10.1109/PRDC67299.2025.00032
Springer - Basic (author-date)Han S, Kim H, Lee H, Moon H, Jeon Y, Bae H, Yeo D, Ahn G-J, Lee S (2025) Dependable Code Repair with LLMs: AI-Driven Vulnerability Detection and Automated Patching
Juristische Zitierweise (Stüber) (Deutsch)Han, Sungmin/ Kim, Hyoungshick/ Lee, Hojoon/ Moon, Hyungon/ Jeon, Yuseok/ Bae, Ho/ Yeo, Donghyun/ Ahn, Gail-Joon/ Lee, Sangkyun, Dependable Code Repair with LLMs: AI-Driven Vulnerability Detection and Automated Patching, 2025, .