CAO, T., SOON NG, W., LING GOH, W., GAO, Y. und HUANG, H., 2026. FPGA-Based Real-Time ECG Classification System Using Quantized Inception-Res Ne Xt Neural Network and CWT Approximation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, IEEE Trans. VLSI Syst. 1 Januar 2026. Vol. 34, no. 1, p. 167-178. DOI 10.1109/TVLSI.2025.3617535.
Elsevier - Harvard (with titles)Cao, T., Soon Ng, W., Ling Goh, W., Gao, Y., Huang, H., 2026. FPGA-Based Real-Time ECG Classification System Using Quantized Inception-Res Ne Xt Neural Network and CWT Approximation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, IEEE Trans. VLSI Syst. 34, 167-178. https://doi.org/10.1109/TVLSI.2025.3617535
American Psychological Association 7th editionCao, T., Soon Ng, W., Ling Goh, W., Gao, Y., & Huang, H. (2026). FPGA-Based Real-Time ECG Classification System Using Quantized Inception-Res Ne Xt Neural Network and CWT Approximation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Very Large Scale Integration (VLSI) Systems, IEEE Transactions On, IEEE Trans. VLSI Syst., 34(1), 167-178. https://doi.org/10.1109/TVLSI.2025.3617535
Springer - Basic (author-date)Cao T, Soon Ng W, Ling Goh W, Gao Y, Huang H (2026) FPGA-Based Real-Time ECG Classification System Using Quantized Inception-Res Ne Xt Neural Network and CWT Approximation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, IEEE Trans. VLSI Syst. 34:167-178. https://doi.org/10.1109/TVLSI.2025.3617535
Juristische Zitierweise (Stüber) (Deutsch)Cao, T./ Soon Ng, W./ Ling Goh, W./ Gao, Y./ Huang, H., FPGA-Based Real-Time ECG Classification System Using Quantized Inception-Res Ne Xt Neural Network and CWT Approximation, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, IEEE Trans. VLSI Syst. 2026, 167-178.