Treffer: Sugar crystals characterization for quality control inspection using digital image processing
Title:
Sugar crystals characterization for quality control inspection using digital image processing
Authors:
Source:
2016 IEEE 36th Central American and Panama Convention (CONCAPAN XXXVI) Central American and Panama Convention (CONCAPAN XXXVI), 2016 IEEE 36th. :1-6 Nov, 2016
Relation:
2016 IEEE 36th Central American and Panama Convention (CONCAPAN XXXVI)
Database:
IEEE Xplore Digital Library