Treffer: The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression Model
Title:
The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression Model
Authors:
Source:
2015 IEEE/ACM 1st International Workshop on Complex Faults and Failures in Large Software Systems (COUFLESS) Complex Faults and Failures in Large Software Systems (COUFLESS), 2015 IEEE/ACM 1st International Workshop on. :7-13 May, 2015
Relation:
2015 IEEE/ACM 1st International Workshop on Complex Faults and Failures in Large Software Systems (COUFLESS)
Database:
IEEE Xplore Digital Library