• Laser and Radiation Testing of...

Treffer: Laser and Radiation Testing of Compiler-Based Protection for Multi-Bit Upsets

Title:
Laser and Radiation Testing of Compiler-Based Protection for Multi-Bit Upsets
Authors:
Baroffio, Davide, Lopez, Tomas Antonio, Reghenzani, Federico, Fornaciari, William
Source:
2025 IEEE 43rd International Conference on Computer Design (ICCD) ICCD Computer Design (ICCD), 2025 IEEE 43rd International Conference on. :499-506 Nov, 2025
Relation:
2025 IEEE 43rd International Conference on Computer Design (ICCD)
Database:
IEEE Xplore Digital Library