Treffer: Optimal Test Case Selection for On-Target Embedded Testing
Title:
Optimal Test Case Selection for On-Target Embedded Testing
Source:
2025 Seventeenth International Conference on Contemporary Computing (IC3) Contemporary Computing (IC3), 2025 Seventeenth International Conference on. :1-6 Aug, 2025
Relation:
2025 Seventeenth International Conference on Contemporary Computing (IC3)
Database:
IEEE Xplore Digital Library