• Towards Seamless Processor-In-...

Treffer: Towards Seamless Processor-In-The-Loop Testing With FMI 3.0

Title:
Towards Seamless Processor-In-The-Loop Testing With FMI 3.0
Authors:
Vanommeslaeghe, Yon, Van Acker, Bert, De Meulenaere, Paul
Source:
2025 ACM/IEEE 28th International Conference on Model Driven Engineering Languages and Systems Companion (MODELS-C) MODELS-C Model Driven Engineering Languages and Systems Companion (MODELS-C), 2025 ACM/IEEE 28th International Conference on. :673-677 Oct, 2025
Relation:
2025 ACM/IEEE 28th International Conference on Model Driven Engineering Languages and Systems Companion (MODELS-C)
Database:
IEEE Xplore Digital Library