Treffer: Automatic Data Redundancy in Safety-Critical Applications Using Trait-Based Code Transformation

Title:
Automatic Data Redundancy in Safety-Critical Applications Using Trait-Based Code Transformation
Authors:
Solouki, Mohammadreza Amel, De Sio, Corrado, Rebaudengo, Maurizio, Sini, Jacopo
Source:
2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2025 IEEE International Symposium on. :1-4 Oct, 2025
Relation:
2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Database:
IEEE Xplore Digital Library