• Evaluating ECC for Cache Relia...

Treffer: Evaluating ECC for Cache Reliability Under Multi-Bit Upsets: A Design Space Exploration

Title:
Evaluating ECC for Cache Reliability Under Multi-Bit Upsets: A Design Space Exploration
Authors:
Kotsimpou, Foteini, Papadimitriou, George, Gizopoulos, Dimitris
Source:
2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2025 IEEE 31st International Symposium on. :01-08 Jul, 2025
Relation:
2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)
Database:
IEEE Xplore Digital Library