Treffer: Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis
Title:
Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis
Authors:
Source:
2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of. :1520-1525 Jun, 2025
Relation:
2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Database:
IEEE Xplore Digital Library