Treffer: Automated Bitstream-Level Cost-Reliability Design-Space Exploration for SRAM-Based FPGAs
Title:
Automated Bitstream-Level Cost-Reliability Design-Space Exploration for SRAM-Based FPGAs
Authors:
Source:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 45(1):218-231 Jan, 2026
Database:
IEEE Xplore Digital Library