• SEU Vulnerability of SRAM Desi...

Treffer: SEU Vulnerability of SRAM Designs at a 3-nm Bulk FinFET Node

Title:
SEU Vulnerability of SRAM Designs at a 3-nm Bulk FinFET Node
Authors:
Pieper, N.J., Xiong, Y., Kronenberg, J.B., Pasternak, J., Ball, D.R., Bhuva, B.L.
Source:
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(8):2671-2679 Aug, 2025
Database:
IEEE Xplore Digital Library