Treffer: No- Reference Image Quality Assessment for Intelligent Sensing Applications

Title:
No- Reference Image Quality Assessment for Intelligent Sensing Applications
Authors:
Yuan, Zhuobin, Ikusan, Ademola, Dai, Rui, Zhang, Junjie
Source:
NAECON 2024 - IEEE National Aerospace and Electronics Conference NAECON 2024 - IEEE National, Aerospace and Electronics Conference. :185-189 Jul, 2024
Relation:
NAECON 2024 - IEEE National Aerospace and Electronics Conference
Database:
IEEE Xplore Digital Library