Treffer: Structural, Syntactic, and Statistical Pattern Recognition ; Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings

Title:
Structural, Syntactic, and Statistical Pattern Recognition ; Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings
Contributors:
Krzyzak, Adam, Suen, Ching Y., Torsello, Andrea, Nobile, Nicola
Source:
Lecture Notes in Computer Science ; ISSN 0302-9743 1611-3349 ; ISBN 9783031230271 9783031230288
Publisher Information:
Springer International Publishing
Publication Year:
2022
Document Type:
Buch book
Language:
unknown
ISBN:
978-3-031-23027-1
978-3-031-23028-8
3-031-23027-2
3-031-23028-0
DOI:
10.1007/978-3-031-23028-8
DOI:
10.1007/978-3-031-23028-8.pdf
Accession Number:
edsbas.2DA54D43
Database:
BASE