ISO-690 (author-date, English)

HUSSAIN, Abid, 2025. POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. International Journal of Advanced Research in Computer Science. 1 Juli 2025. Vol. 16, no. 4, p. 146-153. DOI 10.26483 jarcs.v16 i4.7321.

Elsevier - Harvard (with titles)

Hussain, A., 2025. POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. International Journal of Advanced Research in Computer Science 16, 146-153. https://doi.org/10.26483 jarcs.v16 i4.7321

American Psychological Association 7th edition

Hussain, A. (2025). POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. International Journal of Advanced Research in Computer Science, 16(4), 146-153. https://doi.org/10.26483 jarcs.v16 i4.7321

Springer - Basic (author-date)

Hussain A (2025) POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.. International Journal of Advanced Research in Computer Science 16:146-153. https://doi.org/10.26483 jarcs.v16 i4.7321

Juristische Zitierweise (Stüber) (Deutsch)

Hussain, Abid, POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES., International Journal of Advanced Research in Computer Science 2025, 146-153.

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