ALTHIBAN, Amani S., ALHARBI, Hajar M., AL KHUZAYEM, Lama A. und EASSA, Fathy Elbouraey, 2024. Predicting Software Defects in Hybrid MPI and Open MP Parallel Programs Using Machine Learning. Electronics (2079-9292). 1 Januar 2024. Vol. 13, no. 1, p. 182-212. DOI 10.3390/electronics13010182.
Elsevier - Harvard (with titles)Althiban, A.S., Alharbi, H.M., Al Khuzayem, L.A., Eassa, F.E., 2024. Predicting Software Defects in Hybrid MPI and Open MP Parallel Programs Using Machine Learning. Electronics (2079-9292) 13, 182-212. https://doi.org/10.3390/electronics13010182
American Psychological Association 7th editionAlthiban, A. S., Alharbi, H. M., Al Khuzayem, L. A., & Eassa, F. E. (2024). Predicting Software Defects in Hybrid MPI and Open MP Parallel Programs Using Machine Learning. Electronics (2079-9292), 13(1), 182-212. https://doi.org/10.3390/electronics13010182
Springer - Basic (author-date)Althiban AS, Alharbi HM, Al Khuzayem LA, Eassa FE (2024) Predicting Software Defects in Hybrid MPI and Open MP Parallel Programs Using Machine Learning.. Electronics (2079-9292) 13:182-212. https://doi.org/10.3390/electronics13010182
Juristische Zitierweise (Stüber) (Deutsch)Althiban, Amani S./ Alharbi, Hajar M./ Al Khuzayem, Lama A./ Eassa, Fathy Elbouraey, Predicting Software Defects in Hybrid MPI and Open MP Parallel Programs Using Machine Learning., Electronics (2079-9292) 2024, 182-212.