NOVELLA, Luigi, TUFO, Manuela und FIENGO, Giovanni, 2019. Automatic Test Set Generation for Event-Driven Systems in the Absence of Specifications Combining Testing with Model Inference. Information Technology & Control. 1 April 2019. Vol. 48, no. 2, p. 316-334. DOI 10.5755/j01.itc.48.2.21725.
Elsevier - Harvard (with titles)Novella, L., Tufo, M., Fiengo, G., 2019. Automatic Test Set Generation for Event-Driven Systems in the Absence of Specifications Combining Testing with Model Inference. Information Technology & Control 48, 316-334. https://doi.org/10.5755/j01.itc.48.2.21725
American Psychological Association 7th editionNovella, L., Tufo, M., & Fiengo, G. (2019). Automatic Test Set Generation for Event-Driven Systems in the Absence of Specifications Combining Testing with Model Inference. Information Technology & Control, 48(2), 316-334. https://doi.org/10.5755/j01.itc.48.2.21725
Springer - Basic (author-date)Novella L, Tufo M, Fiengo G (2019) Automatic Test Set Generation for Event-Driven Systems in the Absence of Specifications Combining Testing with Model Inference.. Information Technology & Control 48:316-334. https://doi.org/10.5755/j01.itc.48.2.21725
Juristische Zitierweise (Stüber) (Deutsch)Novella, Luigi/ Tufo, Manuela/ Fiengo, Giovanni, Automatic Test Set Generation for Event-Driven Systems in the Absence of Specifications Combining Testing with Model Inference., Information Technology & Control 2019, 316-334.