WANG, Zhaoyang, CHEN, Haiyong und CAO, Zhen, 2025. CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning. IEEE Transactions on Semiconductor Manufacturing. 1 August 2025. Vol. 38, no. 3, p. 612-623. DOI 10.1109/TSM.2025.3570323.
Elsevier - Harvard (with titles)Wang, Z., Chen, H., Cao, Z., 2025. CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning. IEEE Transactions on Semiconductor Manufacturing 38, 612-623. https://doi.org/10.1109/TSM.2025.3570323
American Psychological Association 7th editionWang, Z., Chen, H., & Cao, Z. (2025). CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning. IEEE Transactions on Semiconductor Manufacturing, 38(3), 612-623. https://doi.org/10.1109/TSM.2025.3570323
Springer - Basic (author-date)Wang Z, Chen H, Cao Z (2025) CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning.. IEEE Transactions on Semiconductor Manufacturing 38:612-623. https://doi.org/10.1109/TSM.2025.3570323
Juristische Zitierweise (Stüber) (Deutsch)Wang, Zhaoyang/ Chen, Haiyong/ Cao, Zhen, CPDD: A Cross-Scenario Photovoltaic Defect Detector Based on Fine-Grained Feature Autoencoding and Pseudo-Box Contrastive Learning., IEEE Transactions on Semiconductor Manufacturing 2025, 612-623.