KIM, Hee Yeon, KIM, Ji Hoon, OH, Ho Kyun, LEE, Beom Jin, MUN, Si Woo, SHIN, Jeong Hoon und KIM, Kyounggon, 2022. DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules. International Journal of Information Security. 1 Februar 2022. Vol. 21, no. 1, p. 1-23. DOI 10.1007/s10207-020-00537-0.
Elsevier - Harvard (with titles)Kim, H.Y., Kim, J.H., Oh, H.K., Lee, B.J., Mun, S.W., Shin, J.H., Kim, K., 2022. DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules. International Journal of Information Security 21, 1-23. https://doi.org/10.1007/s10207-020-00537-0
American Psychological Association 7th editionKim, H. Y., Kim, J. H., Oh, H. K., Lee, B. J., Mun, S. W., Shin, J. H., & Kim, K. (2022). DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules. International Journal of Information Security, 21(1), 1-23. https://doi.org/10.1007/s10207-020-00537-0
Springer - Basic (author-date)Kim HY, Kim JH, Oh HK, Lee BJ, Mun SW, Shin JH, Kim K (2022) DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules.. International Journal of Information Security 21:1-23. https://doi.org/10.1007/s10207-020-00537-0
Juristische Zitierweise (Stüber) (Deutsch)Kim, Hee Yeon/ Kim, Ji Hoon/ Oh, Ho Kyun/ Lee, Beom Jin/ Mun, Si Woo/ Shin, Jeong Hoon/ Kim, Kyounggon, DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules., International Journal of Information Security 2022, 1-23.