Treffer: Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning.
Title:
Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning.
Authors:
Sheng, Yi1 (AUTHOR) sheng_yi05@163.com, Yan, Jinda1 (AUTHOR) jdyan09@163.com, Piao, Minghao1 (AUTHOR) myunghopark@gmail.com
Source:
Journal of Intelligent Manufacturing. Aug2025, Vol. 36 Issue 6, p4129-4141. 13p.
Database:
Business Source Ultimate
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