Treffer: Optimum lot inspection based on lognormal reliability tests.
Title:
Optimum lot inspection based on lognormal reliability tests.
Authors:
Fernández, Arturo J.1 (AUTHOR) ajfernan@ull.es
Source:
International Journal of Production Research. Mar2023, Vol. 61 Issue 5, p1424-1435. 12p. 4 Charts, 5 Graphs.
Database:
Business Source Ultimate
Weitere Informationen
Der Volltext kann Gästen nicht angezeigt werden. Login für vollen Zugriff.